Man Pleads Guilty in DuPont Data Theft Case

By Wayne Rash  |  Posted 2007-02-15 Print this article Print

A former senior scientist at chemical company DuPont has been charged with stealing trade secrets and trying to provide them to his new employer.

The U.S. Attorney for the District of Delaware announced on Feb 15 the unsealing of a one-count industrial espionage case against Yonggang (Gary) Min, formerly a senior scientist for DuPont, the Delaware-based chemical company.

According to the announcement, Min has been charged with stealing trade secrets from DuPont and trying to provide them to his new employer, Victrex, based in London. According to U.S. Attorney Colm F. Connolly, Min could face 10 years in prison and be fined up to $250,000.

According to the record that was unsealed today, Min agreed to plead guilty on November 13, 2006. "Due to the nature of the ongoing investigation, it was appropriate to maintain its status as a sealed matter until today," Connolly told eWEEK.

He said that the record of the guilty plea was unsealed today because it was no longer necessary to keep it sealed.

"He [Min] was charged with theft of trade secrets. As a part of that he admitted that he misappropriated more than 20,000 documents from the electronic database that DuPont has in Delaware. The value is set at 400 million dollars," Connolly said.

Connolly added that sentencing in the case is set for March 29, although he indicated that that date could change.

Read the full story on eWEEK.com: Man Pleads Guilty in DuPont Data Theft Case.

Wayne Rash Wayne Rash is a Senior Analyst for eWEEK Labs and runs the magazine's Washington Bureau. Prior to joining eWEEK as a Senior Writer on wireless technology, he was a Senior Contributing Editor and previously a Senior Analyst in the InfoWorld Test Center. He was also a reviewer for Federal Computer Week and Information Security Magazine. Previously, he ran the reviews and events departments at CMP's InternetWeek.

He is a retired naval officer, a former principal at American Management Systems and a long-time columnist for Byte Magazine. He is a regular contributor to Plane & Pilot Magazine and The Washington Post.

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